The integration of ARNOLD WISE makes a complete traceability possible - from individual wafers to the origin of the ingot.

ARNOLD supplies a special encoding system for the silicon brick with inscription laser, a high-resolution camera system for wafer traceability and – in connection with our Process Control System – for a complete documentation of all production- and process data from ingot to wafer.

This enables our customers to identify for instance cristallization faults in the ingots - even after wafering - in order to optimize production processes.